Specifications
WISE automates regular and accurate wheel measurements and inspects every wheel for both freight and transit systems.
WISE utilizes a modular approach to integrate subsystems for producing required wheel measurements, detecting flat spots and roundness, tread cracks and defects, as well as brake pad and shoe measurements. WISE encompasses patented designs combining laser scanning and high-speed imaging to provide a cost-effective and innovative solution. This system is available for both Low-Speed and High-Speed Rail and can be customized to fit different needs. WISE automates the inspection of every wheel and creates a database of measurements to track trends.
Wheel Profile and Diameter Measurement
- The Wheel Profile/Diameter sub-system incorporates multiple-line lasers and high-speed cameras for measuring large segments of the wheel with advanced non-contact technology. IEM's True Vision technology generates a computer model of each wheel, then computes the measurements for flange thickness, flange height, rim thickness, flange angle, diameter and back-to-back reading. This system is a prerequisite for WISE.
Tread Crack Defect Detection
- The in-line Tread Crack Defect Detection system automatically detects cracks and defects in wheel treads by use of Electro-Magnetic Acoustic Transduction technology. The signals travel the circumference of the wheel and reflect off cracks and defects. If warranted, notification for action is made immediately.
Brake Pad/Shoe Measurement
- IEM's Brake Pad/Shoe Measurement subsystem automatically locates and measure the thickness of brake pads and shoes on each wheel. Upon image capture, IEM's software algorithms register and measure the images and reports the freight car and wheel location requiring a change out.
Flat Spot and Roundness Detection
- A series of impact detectors placed parallel to the rail react when coming into contact with the wheel. A rotating tread plate travels downward to the level of the wear on the wheel. Its movement is digitally measured and transmitted to the central processor. The measurements are analyzed and reported, noting any excessive wear or defects.
